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  • 标题:NIR self-powered photodetection and gate tunable rectification behavior in 2D GeSe/MoSe2 heterojunction diode
  • 本地全文:下载
  • 作者:Muhammad Hussain ; Syed Hassan Abbas Jaffery ; Asif Ali
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2021
  • 卷号:11
  • 期号:1
  • 页码:3688
  • DOI:10.1038/s41598-021-83187-z
  • 出版社:Springer Nature
  • 摘要:Abstract Two-dimensional (2D) heterostructure with atomically sharp interface holds promise for future electronics and optoelectronics because of their multi-functionalities. Here we demonstrate gate-tunable rectifying behavior and self-powered photovoltaic characteristics of novel p-GeSe/n-MoSe 2 van der waal heterojunction (vdW HJ). A substantial increase in rectification behavior was observed when the devices were subjected to gate bias. The highest rectification of ~ 1 × 10 4 was obtained at V g  = − 40 V. Remarkable rectification behavior of the p-n diode is solely attributed to the sharp interface between metal and GeSe/MoSe 2 . The device exhibits a high photoresponse towards NIR (850 nm). A high photoresponsivity of 465 mAW −1 , an excellent EQE of 670%, a fast rise time of 180 ms, and a decay time of 360 ms were obtained. Furthermore, the diode exhibits detectivity (D) of 7.3 × 10 9 Jones, the normalized photocurrent to the dark current ratio (NPDR) of 1.9 × 10 10  W −1 , and the noise equivalent power (NEP) of 1.22 × 10 –13 WHz −1/2 . The strong light-matter interaction stipulates that the GeSe/MoSe 2 diode may open new realms in multi-functional electronics and optoelectronics applications.
  • 其他摘要:Abstract Two-dimensional (2D) heterostructure with atomically sharp interface holds promise for future electronics and optoelectronics because of their multi-functionalities. Here we demonstrate gate-tunable rectifying behavior and self-powered photovoltaic characteristics of novel p-GeSe/n-MoSe 2 van der waal heterojunction (vdW HJ). A substantial increase in rectification behavior was observed when the devices were subjected to gate bias. The highest rectification of ~ 1 × 10 4 was obtained at V g  = − 40 V. Remarkable rectification behavior of the p-n diode is solely attributed to the sharp interface between metal and GeSe/MoSe 2 . The device exhibits a high photoresponse towards NIR (850 nm). A high photoresponsivity of 465 mAW −1 , an excellent EQE of 670%, a fast rise time of 180 ms, and a decay time of 360 ms were obtained. Furthermore, the diode exhibits detectivity (D) of 7.3 × 10 9 Jones, the normalized photocurrent to the dark current ratio (NPDR) of 1.9 × 10 10  W −1 , and the noise equivalent power (NEP) of 1.22 × 10 –13 WHz −1/2 . The strong light-matter interaction stipulates that the GeSe/MoSe 2 diode may open new realms in multi-functional electronics and optoelectronics applications.
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