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文章基本信息

  • 标题:Effect of Test Coverage and Change Point on Software Reliability Growth Based on Time Variable Fault Detection Probability
  • 本地全文:下载
  • 作者:Subhashis Chatterjee ; Ankur Shukla
  • 期刊名称:Journal of Software
  • 印刷版ISSN:1796-217X
  • 出版年度:2016
  • 卷号:11
  • 期号:1
  • 页码:110-117
  • DOI:10.17706/jsw.11.1.110-117
  • 出版社:Academy Publisher
  • 摘要:In past four decades, many software reliability growth models (SRGMs) have been proposed to enhance the reliability of the software system. During the testing process potential fault sites are sensitized to detect the faults. Fault detection probability increases as learning and maturity of the testing personnel increases. Therefore, in this paper a time variant fault detection probability has been introduced and integrated into s-shaped coverage SRGM. Experimental results shows that the proposed model is better and will be helpful to improve the accuracy of the software reliability estimation.
  • 其他关键词:exponential fault detection probability, non-homogeneous Poisson process (NHPP), software reliability growth model, software reliability, s-shaped testing coverage.
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