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  • 标题:Trigeminal somatosensory evoked potential test as an evaluation tool for infraorbital nerve damage
  • 本地全文:下载
  • 作者:Woo Taik Hong ; Jin-hee Choi ; Ji Hyun Kim
  • 期刊名称:Archives of Craniofacial Surgery
  • 印刷版ISSN:2287-1152
  • 出版年度:2019
  • 卷号:20
  • 期号:4
  • 页码:223-227
  • DOI:10.7181/acfs.2019.00234
  • 出版社:KoreaMed Synapse
  • 摘要:Neurosensory changes are frequently observed in the patients with mid-face fractures, and these symptoms are often caused by infraorbital nerve (ION) damage. Although ION damage is a relatively common phenomenon, there are no established and objective methods to evaluate it. The aim of this study was to test whether trigeminal somatosensory evoked potential (TSEP) could be used as a prognostic predictor of ION damage and TSEP testing was an objective method to evaluate ION injury. In this prospective TSEP study, 48 patients with unilateral mid-face fracture (only unilateral blow out fracture and unilateral zygomaticomaxillary fracture were included) and potential ION damages were enrolled. Both sides of the face were examined with TSEP and the non-traumatized side of the face was used as control. We calculated the latency difference between the affected and the unaffected sides. Twenty-four patients recovered within 3 months, and 21 patients took more than 3 months to recover. The average latency difference between the affected side and unaffected side was 1.4 and 4.1 ms for the group that recovered within 3 months and the group that recovered after 3 months, respectively. Patients who suffered ION damage showed prolonged latency when examined using the TSEP test. TSEP is an effective tool for evaluation of nerve injury and predicting the recovery of patients with ION damage.
  • 关键词:Evoked potentials; somatosensory;Orbital fractures;Trigeminal nerve injuries
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