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  • 标题:High Definition X-Ray Fluorescence: Principles and Techniques
  • 本地全文:下载
  • 作者:Z. W. Chen ; Walter M. Gibson ; Huapeng Huang
  • 期刊名称:X-Ray Optics and Instrumentation
  • 印刷版ISSN:1687-7632
  • 电子版ISSN:1687-7640
  • 出版年度:2008
  • 卷号:2008
  • DOI:10.1155/2008/318171
  • 出版社:Hindawi Publishing Corporation
  • 摘要:

    Energy dispersive X-ray fluorescence (EDXRF) is a well-established and powerful tool for nondestructive elemental analysis of virtually any material. It is widely used for environmental, industrial, pharmaceutical, forensic, and scientific research applications to measure the concentration of elemental constituents or contaminants. The fluorescing atoms can be excited by energetic electrons, ions, or photons. A particular EDXRF method, monochromatic microfocus X-ray fluorescence (M μ EDXRF), has proven to be remarkably powerful in measurement of trace element concentrations and distributions in a large variety of important medical, environmental, and industrial applications. When used with state-of-the-art doubly curved crystal (DCC) X-ray optics, this technique enables high-sensitivity, compact, low-power, safe, reliable, and rugged analyzers for insitu, online measurements in industrial process, clinical, and field settings. This new optic-enabled M μ EDXRF technique, called high definition X-ray fluorescence (HD XRF), is described in this paper.

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