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文章基本信息

  • 标题:Model-Driven Validation of SystemC Designs
  • 本地全文:下载
  • 作者:Hiren D. Patel ; Sandeep K. Shukla
  • 期刊名称:EURASIP Journal on Embedded Systems
  • 印刷版ISSN:1687-3955
  • 电子版ISSN:1687-3963
  • 出版年度:2008
  • 卷号:2008
  • DOI:10.1155/2008/519474
  • 出版社:Hindawi Publishing Corporation
  • 摘要:

    Functional test generation for dynamic validation of current system level designs is a challenging task. Manual test writing or automated random test generation techniques are often used for such validation practices. However, directing tests to particular reachable states of a SystemC model is often difficult, especially when these models are large and complex. In this work, we present a model-driven methodology for generating directed tests that take the SystemC model under validation to specific reachable states. This allows the validation to uncover very specific scenarios which lead to different corner cases. Our formal modeling is done entirely within the Microsoft SpecExplorer tool to formally describe the specification of the system under validation in the formal notation of AsmL. We also exploit SpecExplorer's abilities for state space exploration for our test generation, and its APIs for connecting the model to real programs to drive the validation of SystemC models with the generated test cases.

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