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文章基本信息

  • 标题:Measuring static complexity
  • 本地全文:下载
  • 作者:Ben Goertzel
  • 期刊名称:International Journal of Mathematics and Mathematical Sciences
  • 印刷版ISSN:0161-1712
  • 电子版ISSN:1687-0425
  • 出版年度:1992
  • 卷号:15
  • 期号:1
  • 页码:161-174
  • DOI:10.1155/S0161171292000188
  • 出版社:Hindawi Publishing Corporation
  • 摘要:

    The concept of “pattern” is introduced, formally defined, and used to analyze various measures of the complexity of finite binary sequences and other objects. The standard Kolmogoroff-Chaitin-Solomonoff complexity measure is considered, along with Bennett's ‘logical depth’, Koppel's ‘sophistication'’, and Chaitin's analysis of the complexity of geometric objects. The pattern-theoretic point of view illuminates the shortcomings of these measures and leads to specific improvements, it gives rise to two novel mathematical concepts--“orders” of complexity and “levels” of pattern, and it yields a new measure of complexity, the “structural complexity”, which measures the total amount of structure an entity possesses.

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