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文章基本信息

  • 标题:Incorporating Generalized Modified Weibull TEF in to Software Reliability Growth Model and Analysis of Optimal Release Policy
  • 本地全文:下载
  • 作者:Shaik. Mohammad Rafi ; K.Nageswara Rao ; Shaheda Akthar
  • 期刊名称:Computer and Information Science
  • 印刷版ISSN:1913-8989
  • 电子版ISSN:1913-8997
  • 出版年度:2010
  • 卷号:3
  • 期号:2
  • 页码:145
  • DOI:10.5539/cis.v3n2p145
  • 出版社:Canadian Center of Science and Education
  • 摘要:

    Software reliability is generally a key factor in software quality. Reliability is an essential ingredient in customer satisfaction. In software development process reliability conveys the information to managers to access the testing effort and time at which software release into the market. Large numbers of papers are published in this context. In this paper we proposed a software reliability growth model with generalized modified weibull testing effort. Performance application of proposed model is demonstrated through real datasets. The experimental results shown that the model gives an excellent performance compared to other models. We also discuss the optimal release time based on reliability requirement and cost criteria.

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