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  • 标题:Micro-Architecture Support for Integrity Measurement on Dynamic Instruction Trace
  • 本地全文:下载
  • 作者:Hui Lin ; Gyungho Lee
  • 期刊名称:Journal of Information Security
  • 印刷版ISSN:2153-1234
  • 电子版ISSN:2153-1242
  • 出版年度:2010
  • 卷号:1
  • 期号:1
  • 页码:1-10
  • DOI:10.4236/jis.2010.11001
  • 出版社:Scientific Research Publishing
  • 摘要:Trusted computing allows attesting remote system’s trustworthiness based on the software stack whose integrity has been measured. However, attacker can corrupt system as well as measurement operation. As a result, nearly all integrity measurement mechanism suffers from the fact that what is measured may not be same as what is executed. To solve this problem, a novel integrity measurement called dynamic instruction trace measurement (DiT) is proposed. For DiT, processor’s instruction cache is modified to stores back instructions to memory. Consequently, it is designed as a assistance to existing integrity measurement by including dynamic instructions trace. We have simulated DiT in a full-fledged system emulator with level-1 cache modified. It can successfully update records at the moment the attestation is required. Overhead in terms of circuit area, power consumption, and access time, is less than 3% for most criterions. And system only introduces less than 2% performance overhead in average.
  • 关键词:Integrity Measurement; Remote Attestation; Software Vulnerability; Trusted Computing
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