出版社：SISSA, Scuola Internazionale Superiore di Studi Avanzati
摘要：We studied radiation damage of MPPC using 60Co γ-rays, up to total accumulated dose of 240 Gy.
Leakage current and dark noise rate increase as a function of radiation dose. On the other hand,
no significant change was observed for gain and crosstalk. After 240 Gy irradiation, we observed
large dark-noise pulses as well as localized spots with leakage current along the outer edge and
bias line of the device. This study will provide important information for practical application
and for identification of issues for future developments.
