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  • 标题:Test Generation for a Protocol Specified in SDL with Complex Loops by Event-based EFSM Modeling
  • 本地全文:下载
  • 作者:Tae-Hyong Kim
  • 期刊名称:International Journal of Computer Science and Network Security
  • 印刷版ISSN:1738-7906
  • 出版年度:2008
  • 卷号:8
  • 期号:3
  • 页码:122-129
  • 出版社:International Journal of Computer Science and Network Security
  • 摘要:Test case generation for a network protocol by extended finite state machine (EFSM) based modeling is a well-known technique in formal methods in conformance testing. An input output based EFSM (IOEFSM) is a popular model for a protocol specified in the specification and description language (SDL) because an SDL process diagram is based on an input-driven EFSM. However, as an SDL specification may have a very complicated part such as complex nested loops, IOEFSM modeling may not be appropriate to represent such a complex SDL specification. This paper proposes a test generation method for a protocol specified in SDL using an event-based EFSM (EEFSM) for more exact modeling. It also shows the relations between an IOEFSM and an EEFSM, and their inter-conversion methods. Empirical results with a real network protocol, the service specific connection oriented protocol (SSCOP) showed the efficacy of the proposed method.
  • 关键词:Test generation, SDL, EFSM Modeling, Loop testing
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