期刊名称：Neural Information Processing: Letters and Reviews
电子版ISSN：1738-2532
出版年度：2006
卷号：10
期号：11
页码：261-266
出版社：Neural Information Processing
摘要：System reliability is an important design measure in many systems engineering fields. In this paper,
we propose a new neural network method combining stochastic competitive scheme and hysteresis
quantized neuron for the reliability optimization. In the proposed algorithm, the neurons are divided
into two classes: One is binary neurons with stochastic competitive scheme and the other is quantized
neuron with hysteresis. The competitive scheme always provides a feasible solution and search space
is greatly reduced without a burden on the parameter tuning. Furthermore, the stochastic dynamics and
hysteresis can help the neural network escape from local minima, and therefore the proposed algorithm
can get better results than other neural network method
