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  • 标题:Design of a Novel Fault Tolerant Reversible Full Adder for Nanotechnology Based Systems
  • 本地全文:下载
  • 作者:Majid Haghparast ; Keivan Navi
  • 期刊名称:World Applied Sciences Journal
  • 印刷版ISSN:1818-4952
  • 电子版ISSN:1991-6426
  • 出版年度:2008
  • 卷号:3
  • 期号:01
  • 出版社:International Digital Organization for Scientific Information Publications
  • 摘要:

    Reversible computation plays an important role in the synthesis of circuits having application in
    quantum computing, low power CMOS design, bioinformatics and nanotechnology-based systems.
    Conventional logic circuits are not reversible. A reversible circuit maps each input vector, into a unique
    output vector and vice versa. We demonstrate how the well-known and very useful, Toffoli gate can be
    synthesized from only two parity-preserving reversible gates. Parity preserving reversible gates refers to
    those reversible gates for which the parity of the outputs matches that of the inputs. The proposed parity
    preserving Toffoli gate renders a wide class of circuit faults readily detectable at the circuit’s outputs. It
    allows any fault that affects no more than a single signal to be detectable at the circuit’s primary outputs.
    We show that our proposed parity-preserving Toffoli gate is much better in terms of number of reversible
    gates, number of garbage outputs and hardware complexity with compared to the existing counterpart.
    Then we apply the proposed fault tolerant Toffoli gate to the design of a fault tolerant reversible full adder,
    which is a versatile and widely used building block in computer arithmetic.

  • 关键词:Design;Novel;Faults;Full Adders;Nanotechnology;Systems
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