This paper deals with simple time-step stress Partially Accelerated Life Tests (PALT) where a pre-specified censoring time is involved. The time to failure is assumed to have a two-parameter Pareto lifetime distribution of the second kind. Maximum likelihood estimates (MLE) of the PALT model parameters are obtained. In addition, confidence intervals estimation for the parameters is presented. Optimum plans for simple step-stress PALT are also considered. Such plans minimize the generalized asymptotic variance (GAV) of the MLE of the model parameters. For illustration, numerical examples are given.