This work uses transfer-matrix method for calculating the radiative properties. Doped silicon is used
and Coherent Formulation is applied. The considered wavelengths are 0.5 ìm for visible range and 0.9 ìm for
infrared wavelength. Results showed that in visible wavelength, reflectance increases when incidence
angle increases up to 50° and then a little decreasing happens for reflectance till incidence angle reaches 65°.
Reflectance increases rapidly for incidence angle between 65° to 89°. In infrared wavelength, reflectance
increases smoothly with increasing in incidence angle up to 54° for silicon dioxide coating and then it increases
rapidly. But for silicon nitride coating the reflectance decreases with increasing incidence angle up to 54° and
then it increases rapidly. In infrared wavelength, Silicon dioxide coating has higher emittance than silicon nitride
coating for 0°#2# 17° and 82°#2#89°, but for 18° #2# 81° silicon nitride coating has higher emittance than
silicon dioxide coating. Therefore thermal radiaitive properties of nanoscale multilayer structures strongly
depend on incidence angle.