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  • 标题:Low Rate Is Insufficient for Local Testability
  • 本地全文:下载
  • 作者:Eli Ben-Sasson ; Michael Viderman
  • 期刊名称:Electronic Colloquium on Computational Complexity
  • 印刷版ISSN:1433-8092
  • 出版年度:2010
  • 卷号:2010
  • 出版社:Universität Trier, Lehrstuhl für Theoretische Computer-Forschung
  • 摘要:Locally testable codes are error-correcting codes for which membership of a given word in the code can be tested probabilistically by examining it in very few locations. A linear code C\Fn2 is called sparse if dim(C)=O(log(n)). We say that a code C\Fn2 is -biased if all nonzero codewords of C have relative weight in the range (21−21+), where may be a function of n. Kaufman and Sudan \cite{KS07} proved that all sparse linear codes with relative distance 21−n−(1) are locally testable. Moreover, they showed that all sparse n−(1)-biased linear codes are locally decodable. In particular sparse random codes are locally testable and are locally decodable with probability 1−o(1). Kopparty and Saraf \cite{KopS09} conjectured that all sparse linear codes (even with a bad distance) are locally testable. In this paper we refute this conjecture by showing that for every d(n) ranging from (1) to (n) there exists a family of codes \setC(n)\Fn2n\ints with linear distance and dim(C(n))=(d(n)) which are not locally testable (decodable). Furthermore, we show that there exists a family of codes \setC(n)\Fn2n\ints with bias n−o(1) and dim(C(n))=log(n) which are not locally testable (decodable). This also shows that the results of Kaufman and Sudan \cite{KS07} were surprisingly tight. Changes to previous version: The tight upper bound on the redundancy of the tester for LTC was added.
  • 关键词:Locally decodable codes, Locally testable codes, redundancy of testers, sparse codes
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