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  • 标题:Looking ahead A glimpse into microbeam analysis
  • 本地全文:下载
  • 作者:Prof. Rongshu Zeng ; Prof. Dehui Cheng ; Prof. Zhuoran Lin
  • 期刊名称:ISO Focus
  • 出版年度:2006
  • 卷号:2006
  • 期号:may
  • 出版社:International Organization for Standardization
  • 摘要:As a modern basic instrumental analytical technique, microbeam analysis involves worldwide commercial manufacturing and sale of sophisticated instrumentation, including electron microprobe (EMP), scanning electron microscope (SEM), analytical electron microscope (AEM) and energy dispersive x-ray spectroscope (EDX)., and operation and services of microbeam analysis laboratories (governmental, commercial, academic or educational).
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