摘要：We present a novel methodology for test case generation based on UML sequence diagrams. We create message dependence graphs (MDG) from UML sequence diagrams. Edge marking dynamic slicing method is applied on MDG to create slices. Based on the slice created with respect to each predicate on the sequence diagram, we generate test data. We formulate a test adequacy criterion named slice coverage criterion. Test cases that we generate achieves slice coverage criterion. Our approach achieves slice test coverage with few test cases. We generate effective test cases for cluster level testing.
