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  • 标题:Sequence Diagram Test Case Specification and Virtual Integration Analysis using Timed-Arc Petri Nets
  • 本地全文:下载
  • 作者:Sven Sieverding ; Christian Ellen ; Peter Battram
  • 期刊名称:Electronic Proceedings in Theoretical Computer Science
  • 电子版ISSN:2075-2180
  • 出版年度:2013
  • 卷号:108
  • 页码:17-31
  • DOI:10.4204/EPTCS.108.2
  • 出版社:Open Publishing Association
  • 摘要:In this paper, we formally define Test Case Sequence Diagrams (TCSD) as an easy-to-use means to specify test cases for components including timing constraints. These test cases are modeled using the UML2 syntax and can be specified by standard UML-modeling-tools. In a component-based design an early identification of errors can be achieved by a virtual integration of components before the actual system is build. We define such a procedure which integrates the individual test cases of the components according to the interconnections of a given architecture and checks if all specified communication sequences are consistent. Therefore, we formally define the transformation of TCSD into timed-arc Petri nets and a process for the combination of these nets. The applicability of our approach is demonstrated on an avionic use case from the ARP4761 standard.
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