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  • 标题:SECURITY PROCESSING FOR HIGH END EMBEDDED SYSTEM WITH CRYPTOGRAPHIC ALGORITHMS
  • 本地全文:下载
  • 作者:M.Shankar ; Dr.M.Sridar ; Dr.M.Rajani
  • 期刊名称:International Journal of Computer Science and Management Studies
  • 电子版ISSN:2231-5268
  • 出版年度:2012
  • 卷号:12
  • 期号:1
  • 出版社:Imperial Foundation
  • 摘要:Extended Finite State Machine uses the formal description language to model the requirement specification of the system. The system models are frequently changed because of the specification changes. We can show the changes in specification by changing the model represented using finite state machine. To test the modified parts of the model the selective test generation techniques are used. However, the regression test suits still may be very large according to the size. In this paper, we have discussed the method which define the test suits reduction and the requirement specification that used for testing the main system after the modifications in the requirements and implementation. Extended finite state machine uses the state transition diagram for representing the requirement specification. It shows how system changes states and action and variable used during each transition. After that data dependency and control dependency are find out among the transitions of state transition diagram. After these dependencies we can find out the affecting and affected portion in the system introduced by the modification. The main condition is: “If two test cases generate same affecting and affected pattern, it means it is enough to implement only one test case rather than two.” So using this approach we can substantially reduce the size of original test suite.
  • 关键词:Interaction Patterns; EFSM dependencies; Data dependencies
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