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  • 标题:Comparison of Different type parity preserving Reversible gates and Simple Reversible Gates
  • 本地全文:下载
  • 作者:Nidhi Syal ; Dr. H.P.Sinha ; Sheenu
  • 期刊名称:International Journal of Research and Innovation in Computer Engineering
  • 电子版ISSN:2249-6580
  • 出版年度:2011
  • 卷号:1
  • 期号:1
  • 页码:29-35
  • 出版社:Innovation Science Publications
  • 摘要:The complexity of hardware is increasing in daily usages portable devices which in turn require low power for its long life. In the recent years, reversible logic has emerged as a promising technology having its applications in low power CMOS, nanotechnology, and optical computing. The classical set of gates such as AND, OR, and EXOR are not reversible. In this paper, a brief study of reversible & fault tolerant gate is done. The paper is emphasized on use of fault tolerant Fredkin and IG gates for implementing Boolean functions. Simulations of Fredkin and IG gate for performing AND operation & addition is shown. Based on their analysis report a comparison table is made which validates the choice of these gates to be best among existing reversible gates. The reversible gates have been implemented using VHSIC hardware description language (VHDL) on Xilinx ISE8.2i for Spartan 3E board.
  • 关键词:power; speed; reversible gate; adder
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