期刊名称：International Journal of Soft Computing & Engineering
电子版ISSN：2231-2307
出版年度：2012
卷号：2
期号：5
页码：281-285
出版社：International Journal of Soft Computing & Engineering
摘要：This paper presents a modified March (8n) test algorithm to the Built-In Self-Test (BIST) for Single Port Memory. In this algorithm, test patterns are complemented to generate state-transitions that are needed for the detection of frequently occurring as well as newer occurring faults with the shrinking of channel length. The test pattern will be generated for the single port memory. The use of 8n pattern to generate state transition allow to reducing both of time and energy for detection of faults. As a result, the number of test patterns required is very less than of the traditional method, while the extra hardware is negligible.
