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  • 标题:Test Generation for Analog and Mixed-Signal Circuits Using Hybrid System Models
  • 本地全文:下载
  • 作者:Tarik NAHHAL ; Thao Dang
  • 期刊名称:International Journal of VLSI Design & Communication Systems
  • 印刷版ISSN:0976-1527
  • 电子版ISSN:0976-1357
  • 出版年度:2011
  • 卷号:2
  • 期号:3
  • 出版社:Academy & Industry Research Collaboration Center (AIRCC)
  • 摘要:In this paper we propose an approach for testing time-domain properties of analog and mixed-signal circuits. The approach is based on an adaptation of a recently developed test generation technique for hybrid systems and a new concept of coverage for such systems. The approach is illustrated by its application to some benchmark circuits.
  • 关键词:Hybrid System; Formal Methods in Conformance Testing; Analog and Mixed-Signal Circuit.
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