期刊名称：International Journal of VLSI Design & Communication Systems
印刷版ISSN：0976-1527
电子版ISSN：0976-1357
出版年度：2012
卷号：3
期号：5
出版社：Academy & Industry Research Collaboration Center (AIRCC)
摘要：March algorithms are known for memory testing because March-based tests are all simple and possess good fault coverage hence they are the dominant test algorithms implemented in most modern memory BIST. As March algorithms are well known algorithms for testing embedded RAMS, out of which March C- is known for finding all SAF, SOF, CF. This March C- is used frequently in the industry also. The proposed march algorithm is modified march c- algorithm which uses concurrent technique. Using this modified march c- algorithm the complexity is reduced to 8n as well as the test time is reduced greatly. Because of concurrency in testing the sequences the test results were observed in less time than the traditional March tests. This technique is applied for a memory of size 256x8 and can be extended to any memory size.
关键词：Embedded RAMS; March c-; Modified March c- algorithm; concurrent technique; complexity; traditional;March tests.
