期刊名称：International Journal of VLSI Design & Communication Systems
印刷版ISSN：0976-1527
电子版ISSN：0976-1357
出版年度：2012
卷号：3
期号：2
出版社：Academy & Industry Research Collaboration Center (AIRCC)
摘要：Testing core based System on Chip [1] is a challenge for the test engineers. To test the complete SOC at one time with maximum fault coverage, test engineers prefer to test each IP-core separately. At speed testing using external testers is more expensive because of gigahertz processor. The purpose of this paper is to develop cost efficient and flexible test methodology for testing digital IP-cores [2]. The prominent feature of the approach is to use microcontroller to test IP-core. The novel feature is that there is no need of test pattern generator and output response analyzer as microcontroller performs the function of both. This approach has various advantages such as at speed testing, low cost, less area overhead and greater flexibility since most of the testing process is based on software.
