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  • 标题:Scope of Reversible Engineering at Gate-Level : Fault - Tolerant Combinational Adders
  • 本地全文:下载
  • 作者:M.Bharathi ; K.Neelima
  • 期刊名称:International Journal of VLSI Design & Communication Systems
  • 印刷版ISSN:0976-1527
  • 电子版ISSN:0976-1357
  • 出版年度:2012
  • 卷号:3
  • 期号:2
  • 出版社:Academy & Industry Research Collaboration Center (AIRCC)
  • 摘要:Reversible engineering has been one of the thrust areas ensuring that continual process of the innovation trends that explore and sustain the resources of the nature. This reversible engineering is used in many fields like quantum computing, low power CMOS design, nanotechnology, optical information processing, digital signal processing, cryptography, etc. These are the digital domain implementations of Reversible and Fault-Tolerant logic gates. Any arbitrary Boolean function can be synthesized by using the proposed parity preserving reversible gates. Not only the possibility of detecting errors is induced inherently in the proposed high speed adders at their output side but also it allows any fault that affects no more than a single signal that is detectable. The fault tolerant reversible full adder circuits are realized by using two IG gates only. The derived fault tolerant full adder is used for designing other arithmetic- logic circuit by using it as fundamental building block. The proposed reversible gate is designed to have less hardware complexity and efficiecyt in terms of gate count, garbage outputs and constant input. In this paper, we design BCD adder using carry select logic, Carry-select and Bypass adders using FG gates, and newly designed TG gates.
  • 关键词:Delay; Miniaturization; Reversibility
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