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文章基本信息

  • 标题:Taxonomy Towards Application Security Metric Generation using Attack Patterns
  • 本地全文:下载
  • 作者:U Jyothi Kameswari ; K Raja Sekhar ; K Seetha Devi
  • 期刊名称:International Journal of Computer Science & Technology
  • 印刷版ISSN:2229-4333
  • 电子版ISSN:0976-8491
  • 出版年度:2011
  • 卷号:2
  • 期号:4Ver 2
  • 出版社:Ayushmaan Technologies
  • 摘要:Attack patterns are extension to design patterns in the context of application security to consider security as functional requirement along with other requirements. Application security metric is one metric where emphasis will be on source code and its development environment including patterns. This paper contains an extension work to the prototype model that was proposed to generate metrics using attack patterns. In that model a generic framework is recommended to generate new patterns along with metric. The framework is extended with appropriate mathematical components and elements. The mathematical work is interrelated to extended finite state machine and temporal logic. The paper is divided in to four sections. Section one covers introduction. Section two refers the mathematical components and elements used in the model. Section three envelops the application of these components in the proposed model. In the final section the results are discussed which are used for verification process involved in implementing the application development process against the pattern solution.
  • 关键词:Attack patterns; security metrics; finite state machine; attack;graphs and prototype model.a
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