期刊名称：International Journal of Computer Technology and Applications
电子版ISSN：2229-6093
出版年度：2011
卷号：2
期号：3
页码：426-430
出版社：Technopark Publications
摘要：Test power is major issue of current scenario of VLSI testing. There are different test pattern generation techniques for testing of combinational circuits. This paper gives a new advancement in automatic test pattern generation method by feeling don’t care bit of the test vector to optimize the switching activities. Finally this concept produces low power testing.
关键词：ATPG method; D Routh’s algorithm; Boolean difference method; Switching activity
