期刊名称：International Journal of Computer Science Issues
印刷版ISSN：1694-0784
电子版ISSN：1694-0814
出版年度：2011
卷号：8
期号：4
出版社：IJCSI Press
摘要：The growing need for efficiently processing and analyzing the information contained in digital images is a continuous challenge in order to apply image processing. Digital images are captured from different imaging media elements like cameras, scanned electron microscopes etc. While going through the imaging process, Images get distorted in various forms resulting in extreme dark or light areas. All these things lead to the loss of information. The goal in each case is to extract useful information. In that case, Image processing extracts useful information by applying various image enhancement and algorithms. In this paper, we have discussed a practical implementation of various enhancement methods for Scanned Electron Microscope (SEM) images and their experimental results. SEM images lead to very dark and light areas in an image. While imaging the information in the front scene is not only the source of information but some scenes on the dark side can also have the useful information. Before processing any further we require to enhance such images and one of the enhancement techniques i.e. Histogram Statistics comes out to be an ideal approach.
关键词：Scanned Electron Microscope; Global Image Enhancement; Histogram Equalization; Local Image Enhancement; and Histogram Statistics
