期刊名称：International Journal of Distributed and Parallel Systems
印刷版ISSN：2229-3957
电子版ISSN：0976-9757
出版年度：2012
卷号：3
期号：4
出版社：Academy & Industry Research Collaboration Center (AIRCC)
摘要：In this paper, scan and ring schemes of the pseudo-ring memory self-testing are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described. It is shown that only small additional logic is required and allows microcontrollers at-speed testing. Moreover, posteriori values are given for some types of memories faults coverage when pseudo-ring testing schemes are applied.
