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  • 标题:Overcoming Testing Challenges in Project Life Cycle using Risk Based Validation Approach
  • 本地全文:下载
  • 作者:K. Nageswara Rao ; A. Pathanjali Sastri
  • 期刊名称:International Journal on Computer Science and Engineering
  • 印刷版ISSN:2229-5631
  • 电子版ISSN:0975-3397
  • 出版年度:2011
  • 卷号:3
  • 期号:3
  • 页码:1232-1239
  • 出版社:Engg Journals Publications
  • 摘要:According to James Whittake, Microsoft Testing Expert and Author, �There are a number of trends that testers are going to have to grapple with. The first is that software is getting better. The result of this is that bugs are going to become harder and harder to find and the weaker testers will be relegated to Darwinian insignificance. Keeping sharp, building skills and maintaining a cutting edge testing knowledge has never been more important�. The key drive for software testing is capturing defects. Testing is becoming a lot more complex. Most software products are not tested thoroughly, so both users and the organizations that write the software expect them to have bugs. There is more and more realization that testing becomes a bottleneck without upfront planning and projects need consider that in software development reducing defects is substantially important. When a project is low on funding or over budget, the first important task that is cut is �Testing�. But limiting testing of a solution will increase the chance of system failure or unknown bugs that can cripple your business. This paper focuses on the approaches that can be considered to reduce the number of defects captured in testing or later phase of testing.
  • 关键词:Domain Test Engineers; Subject Matter Expert; Test Automation; Risk Based Approach.
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