标题：SRGM with logistic-exponential Testing-effort function with change-point and Analysis of Optimal release policies based on increasing the test efficiency.
期刊名称：International Journal on Computer Science and Engineering
印刷版ISSN：2229-5631
电子版ISSN：0975-3397
出版年度：2010
卷号：2
期号：3
页码：504-516
出版社：Engg Journals Publications
摘要：Reliability is the one of the important factor of software quality. Past few decades several software reliability growth models are proposed to access the quality of the software. Main challenging task of reliability growth model is predicting the reliability, total cost at optimal time at, software released into the market. It has been observed that most of the reliability growth models predict the failure rate to be constant during the software testing, but in reality software failure rate changes with testing time. In this paper we have investigated software reliability growth model by incorporating the both change point and testing effort. We incorporated logistic-exponential TEF in software reliability growth model with change-point. We also investigated the how testing efficiency can be increased by adopting the new automated testing tools into the software testing and its effect on the total cost of the software. Experiments are done on real datasets. Parameters are estimated. Results show the better fit.
关键词：Software reliability; Software testing; Non-Homogeneous Poisson Process (NHPP); Change-point; Testing-effort.
