This paper investigates the effects of the electrostatic discharges (ESD) in the circuit industry and characterizes the performance of a protection system under the action of the ESD stresses. The ESD model most used in characterizing the effects of the ESD discharges on semiconductors is the Transmission Line Pulse (TLP). In the process of dealing with the failures of semiconductor devices, were evaluated the input/output current pulses of an inverter structure, in order to estimate the built-in reliability versus ESD events.