首页    期刊浏览 2024年11月24日 星期日
登录注册

文章基本信息

  • 标题:RELIABILITY TEST PLANS FOR TYPE-II EXPONENTIATED LOG-LOGISTIC DISTRIBUTION
  • 本地全文:下载
  • 作者:G. Srinivasa Rao ; R.R.L. Kantam ; K.Rosaiah
  • 期刊名称:Journal of Reliability and Statistical Studies
  • 印刷版ISSN:0974-8024
  • 电子版ISSN:2229-5666
  • 出版年度:2012
  • 卷号:5
  • 期号:1
  • 页码:55-64
  • 出版社:Ankur Printing Palace
  • 摘要:In this paper we consider a generalization of the log-logistic distribution called Type-IIexponentiated log-logistic distribution suggested by Kotz and Nadarajah (2000). The operatingcharacteristic for a sampling plan is determined for the case that a lot of products are submittedfor inspection with lifetimes specified by a Type-II exponentiated log-logistic distribution(TELLD). The resultsare illustrated by a numerical example
  • 关键词:Type;-;II Exponentiated Log;-;logistic Distribution; Reliability Test Plans
国家哲学社会科学文献中心版权所有