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  • 标题:Assessing psychometric reliability and validity of Technology Acceptance Model (TAM) among faculty members at Shahid Beheshti University
  • 本地全文:下载
  • 作者:Mohsen Ameri Shahrabi ; Azam Ahaninjan ; Hamid Nourbakhsh
  • 期刊名称:Management Science Letters
  • 印刷版ISSN:1923-9335
  • 电子版ISSN:1923-9343
  • 出版年度:2013
  • 卷号:3
  • 期号:8
  • 页码:2295-2300
  • DOI:10.5267/j.msl.2013.07.014
  • 出版社:Growing Science
  • 摘要:This paper presents an empirical survey on understanding the content validity and reliability of technology acceptance measurement (TAM) among 278 university professors who worked for university of Shahid Beheshti located in city of Tehran Iran. We use a questionnaire consists of 37 different questions in five categories including perceived usefulness, perceived ease of use, attitude towards the use of technology and operating plan in Likert scale. The proposed study uses first-order confirmatory factor analysis for validity of the questionnaire and Cronbach alpha is employed for measuring the reliability of the questionnaire. The results have confirmed that TAM questionnaire maintains sufficient content validity and reliability. In other words, The measures were refined and stream-lined, resulting in two six-item scales with reliabilities of 0.89 for usefulness and 0.87 for ease of use.

  • 关键词:Technology acceptance measurement; TAM; Confirmatory factor analysis
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