摘要：This paper proposes a new programmable RF Built-In Self-Test (BIST) circuit for 5GHz Wireless LAN. It is fabricated using 0.18-μm SiGe technology. This circuit is useful for testability of GHz-band RF IC devices in a complete RF transceiver environment. The proposed circuit helps it to provide DC output voltages and accurate phase difference. It contains two peak detectors and a phase detector. The proposed circuit showed excellent performance.
