文章基本信息
- 标题：The Case for Preferring Patent-Validity Litigation over Second-Window Review and Gold-Plated Patents: When One Size Doesn't Fit All, How Could Two Do the Trick
- 本地全文：下载
- 作者：Kieff, F. Scott
- 期刊名称：University of Pennsylvania Law Review
- 出版年度：2009
- 卷号：157
- 期号：6
- 页码：1937
- 出版社：University of Pennsylvania Law School
