摘要：In this study, scanning electron microscopy (SEM) and X-ray diffraction technique were used in order to detect possible differences in starch granules caused by irradiation of wheat and flour. One durum and two bread wheat samples were treated with gamma irradiation at 0.5, 1.0, 2.5, 5.0 kGy levels by using a 60Co source. Starch granules isolated from respective flours were examined by using SEM. Irradiation exposure up to 5 kGy did not appear to cause large differences in the starch granules of three wheat samples. In addition, one flour samples was irradiated at 1, 3, 5, 7, 9, 10, 20, 30 kGy levels by using a 137Cs source X-ray diffraction patterns of these flour samples were taken and relative crystallinities of their starches were determined from the areas under diffractograms. In this study all irradiated flour samples had higher relative crystallinity values as compared to control. However the increase was not parallel to the increasing irradiation levels.
