期刊名称：International Journal of Image Processing (IJIP)
电子版ISSN：1985-2304
出版年度：2011
卷号：5
期号：1
页码：25-35
出版社：Computer Science Journals
摘要：This paper presents a novel approach for defect detection of fabric textile. For this purpose, First, all wavelet coefficients were extracted from an perfect fabric. But an optimal subset of These coefficients can delete main fabric of image and indicate defects of fabric textile. So we used Genetic Algorithm for finding a suitable subset. The evaluation function in GA was Shannon entropy. Finally, it was shown that we can gain better results for defect detection, by using two separable sets of wavelet coefficients for horizontal and vertical defects. This approach, not only increases accuracy of fabric defect detection, but also, decreases computation time.
