摘要：This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT). This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output responses of the DUT for fault classification and detection. The novel ELM-based test generation algorithm proposed in this paper contains mainly three aspects of innovation. Firstly, this algorithm saves time efficiently by classifying response space with ELM. Secondly, this algorithm can avoid reduced test precision efficiently in case of reduction of the number of impulse-response samples. Thirdly, a new process of test signal generator and a test structure in test generation algorithm are presented, and both of them are very simple. Finally, the abovementioned improvement and functioning are confirmed in experiments.
