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  • 标题:Correlation of OCT and Hemifield Pattern VEP in Hemianopia
  • 本地全文:下载
  • 作者:Park, Sung Yong ; Park, Sang Hyouk ; Ha, Seung Joo
  • 期刊名称:Journal of the Korean Ophthalmological Society
  • 印刷版ISSN:0378-6471
  • 出版年度:2008
  • 卷号:49
  • 期号:11
  • 页码:1819-1828
  • DOI:10.3341/jkos.2008.49.11.1819
  • 语种:Korean
  • 出版社:The Korean Ophthalmological Society
  • 摘要:Purpose

    To analyze the correlation between RNFL thickness changes measured by OCT and hemifield pattern VEP in hemianopic visual field loss.

    Methods

    Twelve eyes of six patients with hemianopia were studied. Two patients had bitemporal hemianopia caused by chiasmal tumor, one patient had inferior hemianopia caused by traumatic optic neuropathy, and three patients had homonymous hemianopia caused by occipital lobe lesions. The retinal nerve fiber layer thickness around the optic disc was measured by optical coherence tomography (OCT) and visual pattern evoked potentials were measured using hemifield stimulations.

    Results

    Normal eyes of traumatic optic neuropathy patients were excluded from the analysis. The retinal nerve fiber layer thickness as measured by OCT corresponded to the visual field defect in 9 of 11 eyes (81.8%) and the hemifield pattern VEP response corresponded to visual field defect in 7 of 11 eyes (63.6%).

    Conclusions

    RNFL thickness measurement by OCT and hemifield PVEP are useful in evaluation of patients with hemianopia. However, they should be performed with caution, and compared with various clinical examinations because of their incomplete correlation with visual field defects.

  • 关键词:Hemianopia; Hemifield pattern visual evoked potentials; Optical coherence tomography
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