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  • 标题:Bayes Reliability Measures of Lognormal and Inverse Gaussian Distributions under ML-II e-contaminated Class of Prior Distributions
  • 本地全文:下载
  • 作者:Pankaj Sinha ; J. Prabha
  • 期刊名称:Defence Science Journal
  • 印刷版ISSN:0976-464X
  • 出版年度:2010
  • 卷号:60
  • 期号:4
  • 页码:442-450
  • DOI:10.14429/dsj.60.486
  • 语种:English
  • 出版社:Defence Scientific Information & Documentation Centre
  • 摘要:ML-II e-contaminated class of priors are employed to study the sensitivity of Bayes reliability measures for a lognormal (LN) distribution and inverse Gaussian (IG) distribution to mis-specification in the prior is employed. The numerical illustrations suggest that reliability measures of both the distributions are not sensitive to moderate amount of mis-specification in prior distributions belonging to the class of ML-II e-contaminated. Defence Science Journal, 2010, 60(4), pp.442-450 , DOI:http://dx.doi.org/10.14429/dsj.60.486
  • 关键词:Bayes reliability, lognormal distribution, inverse Gaussian distribution, Bayesian methodology
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