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  • 标题:A note on attribute life-testing
  • 本地全文:下载
  • 作者:P.V. Krishna Iyer ; S. K. Bhattacharya
  • 期刊名称:Defence Science Journal
  • 印刷版ISSN:0976-464X
  • 出版年度:2014
  • 卷号:14
  • 期号:3
  • 页码:219-222
  • DOI:10.14429/dsj.14.7154
  • 语种:English
  • 出版社:Defence Scientific Information & Documentation Centre
  • 摘要:We shall consider an attribute life-testing problem with replacement. The term 'attribute life-testing' refers to situation where the actual life of the failed items are not known but only the number of failires in given interval of time is available. In earlier papers life-testing problems of such naturefor the non-replacement case have been treated.
  • 关键词:Life-testing
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