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  • 标题:A Sampling Inspection Scheme Based on Simple Markov Chains
  • 本地全文:下载
  • 作者:P.V. Krishna Iyer ; Tej Narain Srivastava
  • 期刊名称:Defence Science Journal
  • 印刷版ISSN:0976-464X
  • 出版年度:2014
  • 卷号:15
  • 期号:2
  • 页码:55-60
  • DOI:10.14429/dsj.15.7257
  • 语种:English
  • 出版社:Defence Scientific Information & Documentation Centre
  • 摘要:Using the principles of Markov Chains, An inspection procedure for classifying given number of lots, each consisting of a given number of items, into three categories, say A,B and C has been developed. The average percentage of defectives in the accepted lots of different categories have been worked out for a given set of parameters.
  • 关键词:Inspection Procedure
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