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  • 标题:Problem in Life Testing with Changing Failure Rate
  • 本地全文:下载
  • 作者:Tej Narain Srivastava
  • 期刊名称:Defence Science Journal
  • 印刷版ISSN:0976-464X
  • 出版年度:2014
  • 卷号:17
  • 期号:3
  • 页码:163-168
  • DOI:10.14429/dsj.17.7387
  • 语种:English
  • 出版社:Defence Scientific Information & Documentation Centre
  • 摘要:In life test experiments, a situation may arise when the items are put on test at different times and at one particular instant; we know only the time of failure or the time since it is on test if it gas not failed upto that instant . It has been assumed that the probability density function of the life of an item and hence its failure rate changes after an item is on test for certain time. The method of maximum likehood has beenused to estimate the failure rates in the case when the life of an item follows the exponential distribution.
  • 关键词:Life testing;Failure rate
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