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  • 标题:A Unified and Flexible Framework of Imperfect Debugging Dependent SRGMs with Testing-Effort
  • 本地全文:下载
  • 作者:Zhang, Ce ; Cui, Gang ; Liu, Hongwei
  • 期刊名称:Journal of Multimedia
  • 印刷版ISSN:1796-2048
  • 出版年度:2014
  • 卷号:9
  • 期号:2
  • 页码:310-317
  • DOI:10.4304/jmm.9.2.310-317
  • 语种:English
  • 出版社:Academy Publisher
  • 摘要:In order to overcome the limitations of debugging process, insufficient consideration of imperfect debugging and testing-effort (TE) in software reliability modeling and analysis, a software reliability growth model (SRGM) explicitly incorporating imperfect debugging and TE is developed. From the point of view of incomplete debugging and introduction of new fault, software testing process is described and a relatively unified SRGM framework is presented considering TE. The proposed framework models are fairly general models that cover a variety of the previous works on SRGM with ID and TE. Furthermore, a special SRGM incorporating an improved Logistic testing-effort function (TEF) into imperfect debugging modeling is proposed. The effectiveness and reasonableness of the proposed model are verified by published failure data set. The proposed model closer to real software testing has better descriptive and predictive power than other models
  • 关键词:Software Reliability;Software Reliability Growth Model (SRGM);Imperfect Debugging;Testing-Effort
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