作 者:Hany A.Atallah ;Saad Almutairi ;Adel Bedair Abdel-Rahman 等
出 处:International Journal of Electrical and Computer Engineering. 2022 ;12(3):2681-2688.doi:10.11591/ijece.v12i3.pp2681-2688
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:1038386387