作 者:Ait Daoud Rachid ;Amine Abdellah ;Bouikhalene Belaid 等
出 处:International Journal of Electrical and Computer Engineering. 2018 ;8(4):2367-2383.doi:10.11591/ijece.v8i4.pp2367-2383
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174304