作 者:Anh Duy Tran ;Somjit Arch-int ;Ngamnij Arch-int
出 处:International Journal of Electrical and Computer Engineering. 2017 ;7(3):1385-1397.doi:10.11591/ijece.v7i3.pp1385-1397
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:218174791