作 者:CH. Smitha ;R. Satya Prasad ;R. Kiran Kumar
出 处:International Journal of Electrical and Computer Engineering. 2016 ;6(6):3060-3067.doi:10.11591/ijece.v6i6.11511
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:191265557