作 者:Chulhyun Hwang ;Jaean Jeong ;Hoekyung Jung
出 处:International Journal of Electrical and Computer Engineering. 2021 ;11(3):2666.doi:10.11591/ijece.v11i3.pp2666-2673
出 版 社:Institute of Advanced Engineering and Science (IAES)
文 章 ID:259949142